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DRAM内存Moving Inversion+改进算法的研究毕业

2015-07-28 01:08    随着大容量存储芯片在各种系统中的广泛运用。存储芯片的稳定影响着整个系统的稳定性，因此，对存储芯片的测试显得越来越重要。
    目前，从存储芯片的测试成本考虑，高效的测试技术在存储芯片的测试中被普遍使用。针对这一情况，本文对运用最广泛的DRAM内存测试算法进行了研究，通过实验并对不同的内存测试算法作了介绍与比较，特别是对Moving Inversion算法进行改进，提出了具有更高的故障覆盖率，并且具有更好的故障诊断能力的测试算法一Moving Inversion+算法。通过实验，论证了新算法故障诊断能力得到提高。但由于算法的改进，使测试时间略有所增加。
    本论文组织如下:首先理论背景，介绍了DRAM内存的测试技术及测试的发展与基本原理。列举了各种主要的故障模型，然后根据传统的Moving Inversion算法提出了改进的Moving Inversion+算法及测试结构。最后通过实验完成对新算法的评测，得出结论，并完成本文的总结。

DRAM Memory Moving Inversion+ Algorithm Analysis
Abstract
    Along with the widespread utilization of large capacity memory chip in each kind of system, overall stability of system is affected by memory chip's stability, therefore,memory chip test becomes more and more important.
    At present, highly effective test technology is generally used in memory chip's test considering of memory chip's test cost. In view of this situation, this article conducted research to the most widespread DRAM memory test algorithm, made introduction and comparison of different memory test algorithm, analysis the improvement of Moving Inversion algorithm, proposed the Moving Inversion+ algorithm with higher failure coverage rate and better failure diagnosis ability.  Through the experiment, the new algorithm's failure diagnosis ability has been sharpened at the expense of slightly increased testing time. （转载自http://www.ＮＳＥＡＣ.com中国科教评价网）
    This paper organized as following: First, theory background, introduced the DRAM memory test technology, Enumerated main failure model; Then, proposed the improved algorithm一Moving Inversion+ algorithm and its test structure; Finally,  completed evaluation to this new algorithm by experimenting.

目录
第一章绪论....................................................................................................1
1课题背景.............................................................................................1
1. 1. 1可测试性问题简介.............................................................................................1
1. 1. 2测试技术的发展动态.........................................................................................2
2课题的意义及主要工作............................................................................ 3
1. 2. 1课题的意义......................................................................................................... 3
1.2.2本文的主要工作................................................................................................. 3
第二章DRAM内存测性技术与算法.......................................................................... 5
2. 1测试技术......................................................................................................... 5
  2.1.1测试的基本概念................................................................................................. 5
  2. 1. 2测试技术的应用................................................................................................. 6
2. 2存储器测试技术................................................................................................... 7
2. 3 DRAM内存技术概述................................................................................................... 8
2. 4典型的DRAM存储功能故障模型............................................................................10 内容来自www.nseac.com
2. 5常用的DRAM内存测试算法....................................................................................12
第三章改进型MOVING INVERSION内存测试算法.........................................................15
3. 1  DRAM内存MOVING INVERSION算法.............................................................................15
3. 2改进型MOVING}NVERSION+算法..........................................................................……17
3. 3 DRAM内存MOVING INVERSION+算法编译.................................................................... 19
第四章算法实现及实验结果...........................................................................................21
4. 1实验设备介绍..........................................................................................................21
4. 2 DDR2 UD I MM内存基本参数.....................................................................................22
4. 3 MOV I +算法实现........................................................................................................24
4. 4实验结果......................................................................................................27
4. 5结论..........................................................................................................28
参考文献.........................................................................................................29
攻读学位期间公开发表的论文.........................................................................................30
附录............................................................................................................31
致谢.....................................................................................................43


4.5 结论

    从实验数据可以明显发现，通过对MOV工算法的改进，在测试复杂度上由原来的12nlogn变化为14nlogn，测试时间略有所增加，因此，测试时间将会有所增加，按理论计算测试时间: