纳米材料的表征手段

纳米材料的表征手段
 
摘要：本文介绍了纳米材料的几种主要表征方法以及这些表征方法的原理，对纳米材料的行貌、成分、以及结构入手对纳米材料的进行了有效研究。在纳米材料形貌、成分和结构表征中本文分别采用了原子力显微镜（AFM）、俄歇电子能谱（AES）、X射线光电子能谱(XPS)、 X射线衍线（XRD）分析。

关键字：纳米材料；原子力显微镜；俄歇电子能谱；X射线光电子能谱；X射线衍射分析
Methods for Characterizing Nano-materials
          
Abstract:  This article introduced the several methods to characterize nanometer material and the principle of these methods fires. Then the morphology、the ingredient and the structure of nanometer material is introduced. In the morphology study, the ingredient and the structure characterization this article separately used the Atomic Force Microscope (AFM), the Auger Electron Spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), X-ray photoelectron spectroscopy (XRD).

Key Words: Nanometer material; Atomic Force Microscope; Auger Electron Spectroscopy; X-ray photoelectron spectroscopy; X-ray Diffraction
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